Journal Information
Pattern Recognition (PR)
Impact Factor:
Call For Papers
Pattern Recognition is a mature but exciting and fast developing field, which underpins developments in cognate fields such as computer vision, image processing, text and document analysis and neural networks. It is closely akin to machine learning, and also finds applications in fast emerging areas such as biometrics, bioinformatics, multimedia data analysis and most recently data science. The journal Pattern Recognition was established some 50 years ago, as the field emerged in the early years of computer science. Over the intervening years it has expanded considerably.

The journal accepts papers making original contributions to the theory, methodology and application of pattern recognition in any area, provided that the context of the work is both clearly explained and grounded in the pattern recognition literature. Papers whos primary concern falls outside the pattern recognition domain and which report routine applications of it using existing or well known methods, should be directed elsewhere. The publication policy is to publish (1) new original articles that have been appropriately reviewed by competent scientific people, (2) reviews of developments in the field, and (3) pedagogical papers covering specific areas of interest in pattern recognition. Various special issues will be organized from time to time on current topics of interest to Pattern Recognition. Submitted papers should be single column, double spaced, no less than 20 and no more than 35 (40 for a review) pages long, with numbered pages.
Last updated by Dou Sun in 2024-07-12
Special Issues
Special Issue on Conformal Prediction and Distribution-Free Uncertainty Quantification
Submission Date: 2024-09-30

In the rapidly evolving landscape of Machine Learning and Pattern Recognition, the emergence and development of Conformal Prediction (CP) have marked a significant stride towards more reliable predictive models. CP stands out as a versatile framework capable of offering prediction regions with valid coverage guarantees under minimal assumptions. Its unique strength lies in providing probabilistically valid guarantees, which are of paramount importance for complex Pattern Recognition tasks in computer vision, biometrics, text analysis, and other areas where decision certainty is crucial. Highlighting its continual evolution, recent advancements such as Conformal Predictive Distributions, Conformal change-point detection, Venn-Abers predictors, and enhancements like jackknife+ have opened new frontiers in CP, enhancing its applicability and effectiveness. The relevance and growing interest in CP are evident from its increasing presence in academic literature and conferences. In the past few years, the field has seen a consistent growth in scholarly attention, highlighted by the annual Symposium on Conformal and Probabilistic Predictions with Applications (COPA) since 2012, workshops at ICML in 2021 and 2022, and several special issues in leading journals. These platforms have not only contributed to the dissemination of knowledge, but also to the advancement of CP as a critical tool in the realm of Pattern Recognition. This special issue aims to explore innovative research in the rapidly evolving field of Conformal Prediction (CP), focusing on its integration and application within the broader scope of Pattern Recognition. We welcome submissions that demonstrate novel approaches, theoretical insights, and practical applications of CP and its role in advancing the field of Pattern Recognition. Topics of interest include, but are not limited to: Theoretical analyses and performance guarantees of CP. Novel CP approaches and conformity measures. Conformal predictive distributions. Conformal change-point and anomaly detection. Venn-Abers and other multiprobability prediction approaches. Post-hoc calibration through CP. Decision-making through CP and distribution-free uncertainty quantification. Implementations of CP frameworks and algorithms. CP for explainable machine learning and Fairness, Accountability and Transparency (FAT). CP applications in computer vision, image processing, biometrics, security, text analysis and more. CP in real-world applications: challenges and solutions. Guest editors: Harris Papadopoulos, PhD Frederick University, Nicosia, Cyprus Khuong An Nguyen, PhD Royal Holloway University of London, Egham, UK Vineeth Balasubramanian, PhD Indian Institute of Technology, Hyderabad, India Manuscript submission information: The journal submission system (Editorial Manager®) will be open for submissions to our Special Issue from April 24, 2024. When submitting your manuscript please select the article type VSI: Conformal Prediction. Both the Guide for Authors and the submission portal could be found on the Journal Homepage: Guide for authors - Pattern Recognition - ISSN 0031-3203 | by Elsevier. Important dates Submission Portal Open: April 24, 2024 Submission Deadline: September 30, 2024 Acceptance Deadline: May 31, 2025 Keywords: (Conformal Prediction) OR (Uncertainty Quantification) OR (Prediction Regions) OR (Exchangeability) OR (Coverage Guarantee) OR (Prediction Intervals) OR (Probabilistic Prediction) OR (Confidence)
Last updated by Dou Sun in 2024-07-12
Special Issue on Celebrating the Life and Research Contributions of Edwin Hancock
Submission Date: 2024-11-30

Edwin Hancock stood as a towering figure in the realm of pattern recognition and computer vision over the last three decades. His pioneering work, particularly in structural/graph-based pattern recognition, left an indelible mark on the field, shaping its trajectory through his research career. With an impressive portfolio of approximately 1000 academic publications, Edwin's contributions graced the pages of esteemed journals and conferences, solidifying his legacy as a luminary in the academic landscape. Edwin's impact extended beyond his scholarly pursuits; he was pivotal in nurturing community within the pattern recognition research field. His unwavering commitment to advancing the discipline was evident during his tenure as Vice President of the International Association for Pattern Recognition (2016-2018) and as the Editor-in-Chief of the Pattern Recognition journal (2017-2024). In honor of Edwin's remarkable career and profound impact on pattern recognition, this special edition of Pattern Recognition seeks to celebrate his life and research achievements. We warmly invite contributions from colleagues who work in the areas shaped and influenced by Edwin’s contributions, particularly structural pattern recognition and graph-based algorithms. We welcome submissions in two distinct categories: a) Literature Reviews: Contextualize Edwin's work within the broader landscape of pattern recognition, highlighting his scientific contributions and assessing their enduring impact. These reviews should offer insightful analyses of how Edwin's work has shaped the trajectory of research in relevant areas. b) Original Scientific Papers: Submit original research papers within the scope of Edwin's research interests. Authors are encouraged to elucidate the relevance of their work to Edwin's contributions. Moreover, we encourage the submission of posthumous papers co-authored by Edwin, which can be submitted by his collaborators or students, serving as a testament to his enduring legacy. While our primary aim is to honor Edwin's life and outstanding research, we anticipate only one literature review paper the rest contributions will consist of original scientific articles aligned with his research interests. Guest editors: Xiao Bai, PhD Beihang University, Beijing, China Richard C. Wilson, PhD University of York, York, United Kingdom Andrea Torsello, PhD Ca’Foscari University of Venice, Venezia, Italy Bin Luo, PhD Anhui University, Hefei, China Lu Bai, PhD Beijing Normal University, Beijing, China Zhihong Zhang, PhD Xiamen University, Xiamen, China William Smith, PhD University of York, York, United Kingdom Manuscript submission information: The journal submission system (Editorial Manager®) will be open for submissions to our Special Issue from June 30, 2024. When submitting your manuscript please select the article type VSI: Edwin Hancock. Both the Guide for Authors and the submission portal could be found on the Journal Homepage: Guide for authors - Pattern Recognition - ISSN 0031-3203 | by Elsevier. Important dates Submission Portal Open: June 30, 2024 Submission Deadline: November 30, 2024 Acceptance Deadline: January 30, 2025 Keywords: Edwin R. Hancock; Structural Pattern Recognition; Graph based Pattern Recognition
Last updated by Dou Sun in 2024-07-12
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