Basic Information
Name: Yi Liu
Institution: Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences
Registration: 2020-05-15
Score: 143
Tracked Conferences
CCFCOREQUALISShortFull NameSubmissionNotificationConference
aa*a1ICCVInternational Conference on Computer Vision2023-03-082022-07-132023-09-30
aa*a1CVPRIEEE Conference on Computer Vision and Pattern Recognition2022-11-112023-02-272023-06-20
aa*a1AAAIAAAI Conference on Artificial Intelligence2022-08-08 2022-02-22
aa1NeurIPSConference on Neural Information Processing Systems2022-05-162022-09-142022-11-28
aa*MMACM Multimedia2022-03-312022-06-292022-10-10
baa1ECCVEuropean Conference on Computer Vision2022-03-072022-07-032022-10-24
aa*a1ICMLInternational Conference on Machine Learning2022-01-20 2022-07-17
aa*a1IJCAIInternational Joint Conference on Artificial Intelligence2022-01-072022-04-202022-07-23
ShortFull NameSubmissionConference
ICCVInternational Conference on Computer Vision2023-03-082023-09-30
CVPRIEEE Conference on Computer Vision and Pattern Recognition2022-11-112023-06-20
AAAIAAAI Conference on Artificial Intelligence2022-08-082022-02-22
NeurIPSConference on Neural Information Processing Systems2022-05-162022-11-28
MMACM Multimedia2022-03-312022-10-10
ECCVEuropean Conference on Computer Vision2022-03-072022-10-24
ICMLInternational Conference on Machine Learning2022-01-202022-07-17
IJCAIInternational Joint Conference on Artificial Intelligence2022-01-072022-07-23
Attend Conferences
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Tracked Journals
CCFFull NameImpact FactorPublisherISSN
bIEEE Transactions on Neural Networks and Learning Systems11.68IEEE1045-9227
bPattern Recognition7.740Elsevier0031-3203
bIEEE Transactions on Multimedia5.452IEEE1520-9210
aIEEE Transactions on Image Processing2.918IEEE1057-7149
aJournal of Machine Learning Research Microtome Publishing1532-4435
aInternational Journal of Computer Vision7.410Springer0920-5691
aArtificial Intelligence9.088Elsevier0004-3702
aIEEE Transactions on Pattern Analysis and Machine Intelligence17.73IEEE0162-8828
Followed Researchers
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Tracked Jobs
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Viewed Conferences
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Viewed Journals
CCFFull NameImpact FactorPublisherISSN
bPattern Recognition7.740Elsevier0031-3203
bIEEE Transactions on Neural Networks and Learning Systems11.68IEEE1045-9227
bIEEE Transactions on Multimedia5.452IEEE1520-9210
Full NameImpact FactorPublisher
Pattern Recognition7.740Elsevier
IEEE Transactions on Neural Networks and Learning Systems11.68IEEE
IEEE Transactions on Multimedia5.452IEEE