会议信息
RTEST 2018: International Symposium on Real-Time and Embedded Systems and Technologies
http://2018.rtest-conf.org/截稿日期: |
2017-12-10 Extended |
通知日期: |
2018-02-01 |
会议日期: |
2018-05-09 |
会议地点: |
Tehran, Iran |
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征稿
The RTEST symposium aims at bringing researchers in the fields of real-time and embedded systems and related research areas, from both industry and academia together. This event was held as national only event from 1995 to 2014. Starting from 2015 (see this link), RTEST became a successful international symposium and 2018 edition accepts only submissions in English. RTEST 2018 will be held on May 9-10, 2018 at the University of Tehran (College of Engineering), Tehran, Iran. RTEST 2018 welcomes submissions in all theoretical and application-oriented areas, reporting design, analysis, implementation, evaluation, and empirical results, of real-time and embedded systems, Internet-of-Things, and Cyber-Physical Systems, including (but not limited to): real-time software and applications, embedded hardware, multicore and manycore embedded systems, networked/distributed real-time/embedded systems, real-time control systems, real-time and embedded operating systems, hardware/software co-design, system-level design, modeling and verification, real-time scheduling and resource management, quality-of-service (QoS) management, power and thermal management, compilers for embedded systems, WCET estimation, testing and debugging of embedded and real-time systems, dependable real-time systems, and security. Selected papers will be invited to submit an extended version either to a special issue of the Scientia Iranica journal (Transactions on Computer Science & Engineering and Electrical Engineering-http://scientiairanica.sharif.edu/journal/editorial.board#sC_5) for publication after another round of review or to a special issue of the JCSE journal for publication (www.jcse.ir). Another journal is also under negotiation. A separate CFP for the work-in-progress (WiP) sessions will be announced soon on the symposium web site. The publication of accepted papers on IEEE Xplore, as done for RTEST 2015, is under negotiation.
最后更新 Dou Sun 在 2017-11-28
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相关期刊
CCF | 全称 | 影响因子 | 出版商 | ISSN |
---|---|---|---|---|
Design Automation for Embedded Systems | 0.900 | Springer | 0929-5585 | |
Journal of the Association for Information Science and Technology | 2.800 | John Wiley & Sons | 2330-1643 | |
Journal of Decision Systems | Taylor & Francis | 1246-0125 | ||
AEU - International Journal of Electronics and Communications | 3.000 | Elsevier | 1434-8411 | |
Journal of Complex Analysis | Hindawi | 2314-4963 | ||
Smart Learning Environments | 6.700 | Springer | 2196-7091 | |
Artificial Intelligence and Law | 3.100 | Springer | 0924-8463 | |
Journal of the Association of Information Systems | 7.000 | Association for Information Systems | 1536-9323 | |
Journal of Organizational Computing and Electronic Commerce | 2.000 | Taylor & Francis | 1091-9392 | |
Cybernetics and Systems Analysis | 0.500 | Springer | 1060-0396 |
全称 | 影响因子 | 出版商 |
---|---|---|
Design Automation for Embedded Systems | 0.900 | Springer |
Journal of the Association for Information Science and Technology | 2.800 | John Wiley & Sons |
Journal of Decision Systems | Taylor & Francis | |
AEU - International Journal of Electronics and Communications | 3.000 | Elsevier |
Journal of Complex Analysis | Hindawi | |
Smart Learning Environments | 6.700 | Springer |
Artificial Intelligence and Law | 3.100 | Springer |
Journal of the Association of Information Systems | 7.000 | Association for Information Systems |
Journal of Organizational Computing and Electronic Commerce | 2.000 | Taylor & Francis |
Cybernetics and Systems Analysis | 0.500 | Springer |
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