会議情報
MDTS 2021: Microelectronics Design and Test Symposium
https://mdts.ieee.org/
提出日:
2021-03-30
通知日:
2021-04-20
会議日:
2021-05-18
場所:
Albany, New York, USA
年:
30
閲覧: 4028   追跡: 0   出席: 0

論文募集
The Program Committee invites authors to submit original, unpublished papers and panel proposals. Submissions may be in terms of extended summaries or full papers.

Topics of Interest include but are not limited to:

    Digital Circuits, Systems and Architectures: microprocessors, microcontroller, embedded systems, SoC, reconfigurable computing, memory, digital systems for machine learning, deep learning, neuromorphism, security and trusted computing.
    Analog Circuits and Techniques: amplifiers, comparators, oscillators, filters, power supplies, D/A and A/D converters, time-to-digital converters, MEMS.
    RF Circuits and Wireless Transceiver: low noise amplifier, power amplifier, frequency synthesizer, mixer, modulators, phase shifter, innovative RF, mm-wave and THz receiver and transmitter architecture.
    Wireline Communications Circuits and Systems: transceivers for wireline systems, optical links, chip-to-chip communications, I/O interface, interconnections.
    Sensor: sensor and transducer devices, circuits, systems and applications.
    Emerging Technologies: techniques for IoT, aerospace, automotive, biomedical, security, quantum computing.
    Hardware security: Microarchitectural attacks, Side channel attacks and mitigation, Fault injection and mitigation, (Anti-)Reverse engineering and physical attacks, Anti-tamper, Anti-counterfeit, Hardware Obfuscation, computer-aided design for security,  System-on-chip (SoC) security, FPGA and reconfigurable fabric security, Internet-of-things (IoT) security, sensor security, cyber physical system security.

Please submit your paper online by following the Paper Submission Instruction.

Papers found suitable for archival publication will be recommended by the program committee for submission to the “Journal of Electronic Testing: Theory and Applications (JETTA),” published by Springer. In addition, publication in IEEE Xplore® is an option for authors who choose to do this.

Submissions must include:

    Title of paper.
    Name, affiliation, mailing address, e-mail address, phone and fax number of each author.
    Designation of the presenter(s). MDTS will communicate with the presenter.
    One or two topic(s) from the topic list, or a description of your topic.
    An electronic copy of a complete paper of 6 pages, or an extended summary of from three to four pages.
    An abstract of 35 words or less.
最終更新 Dou Sun 2021-03-20
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関連仕訳帳
CCF完全な名前インパクト ・ ファクター出版社ISSN
Microelectronics Reliability1.589Elsevier0026-2714
Microelectronics Journal1.605Elsevier0026-2692
Russian Microelectronics Springer1063-7397
Journal of Electronic Testing0.454Springer0923-8174
International Journal of Advances in Intelligent InformaticsUniversitas Ahmad Dahlan2442-6571
Electronic Journal of e-LearningAcademic Publishing Limited1479-4403
IEEE Journal of Selected Topics in Signal Processing5.301IEEE1932-4553
Journal of Electrical And Electronics Engineering2.339IJRDO2456-6055
Electronics2.412MDPI2079-9292
Chinese Journal of Electronics CIE1022-4653
完全な名前インパクト ・ ファクター出版社
Microelectronics Reliability1.589Elsevier
Microelectronics Journal1.605Elsevier
Russian Microelectronics Springer
Journal of Electronic Testing0.454Springer
International Journal of Advances in Intelligent InformaticsUniversitas Ahmad Dahlan
Electronic Journal of e-LearningAcademic Publishing Limited
IEEE Journal of Selected Topics in Signal Processing5.301IEEE
Journal of Electrical And Electronics Engineering2.339IJRDO
Electronics2.412MDPI
Chinese Journal of Electronics CIE
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