Conference Information
M2GARSS 2020: Mediterranean and Middle-East Geoscience and Remote Sensing Symposium
https://2020.m2garss.org/Submission Date: |
2019-10-13 Extended |
Notification Date: |
|
Conference Date: |
2020-03-09 |
Location: |
Tunis, Tunisia |
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Call For Papers
Hosted by the IEEE Geoscience and Remote Sensing Society (IEEE GRSS), the Mediterranean and Middle-East Geoscience and Remote Sensing Symposium 2020 (M2GARSS 2020) will be held from March 9th to March 11th, 2020 in Tunis, Tunisia.
On behalf of the IEEE GRSS and the M2GARSS 2020 Steering Committee, we invite you to participate in M2GARSS 2020, which will be the 1st Mediterranean and Middle-East (M2) regional symposium of the IEEE GRSS and will contribute to gather M2 and world-class scientists, engineers and educators engaged in the fields of geoscience, remote sensing and related topics. We look forward to meeting you in Tunis during M2GARSS 2020.
Technical Program
M2GARSS will be a premier M2 regional event in remote sensing and will provide an ideal forum for obtaining up-to-date information about the latest developments, exchanging ideas, identifying future trends and networking with the international geoscience and remote sensing communities.
The M2GARSS 2020 technical program will include Oral, Poster and Tutorial Sessions and will deal with the following general themes:
Data Analysis Methods
Atmosphere
Oceans
Land
Missions, Sensors and Calibration
Data Management and Education
In addition, special topics will be addressed, including:
Water resources
Desertification process
Agriculture
Best Oral Presentation and Best Poster
M2GARSS will honor the outstanding achievement of the two best works for the best oral paper and the best poster. The selection of awardees will be done by a scientific committee from the Technical Program Committee of 2MGARSS.
Publication of Proceedings
Accepted papers will be published in the proceedings on IEEE Xplore only if presented at the Symposium by one of the list authors duly registered.
Last updated by Dou Sun in 2019-10-14
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Related Journals
| CCF | Full Name | Impact Factor | Publisher | ISSN |
|---|---|---|---|---|
| b | IEEE Transactions on Geoscience and Remote Sensing | 8.6 | IEEE | 0196-2892 |
| c | IEEE Geoscience and Remote Sensing Letters | 4.000 | IEEE | 1545-598X |
| IEEE Geoscience and Remote Sensing Magazine | 9.6 | IEEE | 2473-2397 | |
| Materials Science and Engineering: C | Elsevier | 0928-4931 | ||
| Materials Science and Engineering: B | 3.900 | Elsevier | 0921-5107 | |
| ISPRS Journal of Photogrammetry and Remote Sensing | 12.2 | Elsevier | 0924-2716 | |
| Inverse Problems in Science and Engineering | 1.100 | Taylor & Francis | 1741-5977 | |
| Materials Science in Semiconductor Processing | 4.6 | Elsevier | 1369-8001 | |
| IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing | 4.700 | IEEE | 1939-1404 | |
| Journal of Computer and Systems Sciences International | 0.500 | Springer | 1064-2307 |
| Full Name | Impact Factor | Publisher |
|---|---|---|
| IEEE Transactions on Geoscience and Remote Sensing | 8.6 | IEEE |
| IEEE Geoscience and Remote Sensing Letters | 4.000 | IEEE |
| IEEE Geoscience and Remote Sensing Magazine | 9.6 | IEEE |
| Materials Science and Engineering: C | Elsevier | |
| Materials Science and Engineering: B | 3.900 | Elsevier |
| ISPRS Journal of Photogrammetry and Remote Sensing | 12.2 | Elsevier |
| Inverse Problems in Science and Engineering | 1.100 | Taylor & Francis |
| Materials Science in Semiconductor Processing | 4.6 | Elsevier |
| IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing | 4.700 | IEEE |
| Journal of Computer and Systems Sciences International | 0.500 | Springer |