Conference Information
VTS 2023: VLSI Test Symposium
Submission Date:
Notification Date:
Conference Date:
San Diego, California, USA
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Call For Papers
You are invited to participate and submit your contributions to VTS’23. The areas of interest include (but are not limited to) the following topics:

VTS Topics

    Analog, Mixed-Signal, RF Test
    ATPG & Compression
    Silicon Debug
    Automotive Test & Safety
    Built-In Self-Test (BIST)
    Defect & Current Based Test
    Defect & Fault Tolerance
    Delay & Performance Test
    Design for Testability, Yield or Reliability
    Pre-silicon Design Verification & Validation
    Post-silicon Validation
    Embedded System & Board Test
    Embedded Test Methods
    Emerging Technologies Test and Reliability
    FPGA Test
    Fault Modeling and Simulation
    Hardware Security
    Low-Power IC Test
    Machine Learning in Test,Yield and Reliability
    Microsystems/MEMS/Sensors Test
    Memory Test and Repair
    On-Line Test & Error Correction
    Power & Thermal Issues in Test
    System-on-Chip (SOC) Test
    Test & Reliability of Biomedical Devices
    Test & Reliability of High-Speed I/O
    Test & Reliability of Machine Learning Systems
    Test Quality & Reliability
    Test Standards & Economics
    Test Resource Partitioning
    Transient & Soft Errors
    2.5D, 3D & SiP Test
    Yield Optimization

New Hot Topics

VTS puts particular emphasis on enlarging its scope soliciting submissions on aspects on the following hot topics:

    Test,  Reliability, and Security of Heterogeneous Devices Including Biomedical, Neuromorphic, and MEMS
    Test & Reliability of Machine Learning Systems 
    Test, Reliability & Security in Quantum Computing
    Design and Test Methods for Yield Improvement
    Machine Learning for Test, Debug, and Yield Improvement
    Reliable in-Field Calibration of mm-Wave Devices
Last updated by Dou Sun in 2022-09-25
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