Conference Information
ITC 2022: International Test Conference
Submission Date:
Notification Date:
Conference Date:
Disneyland, California, USA
CCF: b   CORE: b   QUALIS: a1   Viewed: 53838   Tracked: 20   Attend: 0

Call For Papers
ITC invites submissions on the latest advances in test, validation, diagnosis and security of IPs, ICs, boards and systems.

Topics of interest include, but not limited to:

3D/2.5D Test
5G/6G Test
Adaptive Test in Practice
AI/Machine Learning in Test
ATE/Probe Card Design
Automotive Test
Advances in Boundary Scan
Built-In Self-Test
Data Driven Test Methods
Defect-oriented Testing
Design for Test
DFM and Test
Economics of Test
End-to-End Data Analysis
End-to-End System Security
Emerging Defect Mechanisms
Field Monitoring, Test, & Debug
Hardware Security and Trust
IoT Testing
Jitter, High-Speed I/O and RF Test
Known-Good-Die Test
Memory Test and Repair
MEMS Testing
Mixed-Signal and Analog Test
New Technologies and Test
Online Test
Pre-Silicon/Post-Silicon Verification
Power Issues in Test
Protocol-aware Test
Quantum Device Testing
Reliability and Resilience
SoC/SiP/NoC Test
Silicon Debug
Simulation and Emulation
System Test (Applications)
System Test (Hardware/Software)
Test Compression
Test-to-Design Feedback
Test Escape Analysis
Test Flow Optimizations
Test Generation and Validation
Test Resource Partitioning
Test Standards
Testing High Speed Optics/Photonics
Timing Test
Yield Analysis and Optimization
Last updated by Dou Sun in 2022-02-27
Acceptance Ratio
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Full NameImpact FactorPublisher
Journal of Heuristics1.682Springer
International Journal of Human Capital and Information Technology ProfessionalsIGI Global Publishing
ICT Express4.317Elsevier
IEEE Access4.098IEEE
Advanced Robotics0.920Taylor & Francis
Real-Time Systems0.550Springer
Mobile Information Systems0.849Hindawi
International Journal of Information Systems and Supply Chain ManagementIGI Global
IEEE Network8.808IEEE