Información de la conferencia
HVC 2016: Haifa Verification Conference
https://www.research.ibm.com/haifa/conferences/hvc2016/Día de Entrega: |
2016-07-14 |
Fecha de Notificación: |
2016-09-05 |
Fecha de Conferencia: |
2016-11-14 |
Ubicación: |
Haifa, Israel |
Años: |
15 |
QUALIS: b4 Vistas: 13295 Seguidores: 0 Asistentes: 0
Solicitud de Artículos
HVC 2016 invites the submission of technical papers reporting original research and experience results in all sub-fields of testing and verification applicable to software and hardware. The conference will involve the presentation of peer-reviewed, original technical papers, as well as lectures by guests from industry and academia. The conference proceedings will be published in Springer's Lecture Notes in Computer Science series (LNCS), and handed out in digital format to registered guests of the conference. Topics of interest to the conference include, but are not limited to: Simulation-based verification Formal and semi-formal specification, modeling, and verification Functional and non-functional software testing Software and hardware equivalence checking SAT/SMT-based verification algorithms Static analysis Model checking High-level stimuli generation Hardware/software co-verification Triage and debug technologies Post-silicon validation including emulation and acceleration Coverage analysis and test minimization Testing of mobile and cloud applications Software artifacts review and inspection Test planning Empirical studies on hardware and software quality Security verification Machine learning techniques for verification Student grants We anticipate a number of student grants to cover part of the travel expenses for full-time students who are authors of accepted papers. Precedence in allocation of these travel grants will be to students who are also presenting a poster at the conference.
Última Actualización Por Xin Yao en 2016-07-12
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Digital Signal Processing | 2.900 | Elsevier |
Journal of Cybersecurity | 2.900 | Oxford University Press |
Nano Energy | 16.80 | Elsevier |
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