Basic Information
Name: Ha Ha
Institution: National University of Defense Technology
Registration: 2024-03-19
Score: 519
Tracked Conferences
CCF | CORE | QUALIS | Short | Full Name | Submission | Notification | Conference |
---|---|---|---|---|---|---|---|
b | a | b2 | CogSci | Annual Meeting of the Cognitive Science Society | 2025-02-01 | 2025-04-12 | 2025-07-30 |
Short | Full Name | Submission | Conference |
---|---|---|---|
CogSci | Annual Meeting of the Cognitive Science Society | 2025-02-01 | 2025-07-30 |
Attend Conferences
CCF | CORE | QUALIS | Short | Full Name | Conference | Location |
---|---|---|---|---|---|---|
No results found. |
Full Name | Conference | Location |
---|---|---|
No results found. |
Tracked Journals
CCF | Full Name | Impact Factor | Publisher | ISSN |
---|---|---|---|---|
No results found. |
Full Name | Impact Factor | Publisher |
---|---|---|
No results found. |
Followed Researchers
Name | Institution | Registration | Score |
---|---|---|---|
No results found. |
Name | Institution | Score |
---|---|---|
No results found. |
Tracked Jobs
Job Title | Employer | Job Location |
---|---|---|
No results found. |
Job Title | Employer | Job Location |
---|---|---|
No results found. |
Viewed Conferences
CCF | CORE | QUALIS | Short | Full Name | Submission | Notification | Conference |
---|---|---|---|---|---|---|---|
No results found. |
Short | Full Name | Submission | Conference |
---|---|---|---|
No results found. |
Viewed Journals
CCF | Full Name | Impact Factor | Publisher | ISSN |
---|---|---|---|---|
Applied Sciences | 2.500 | MDPI | 2076-3417 | |
Information Fusion | 15.5 | Elsevier | 1566-2535 | |
b | Information Processing & Management | 6.9 | Elsevier | 0306-4573 |
a | IEEE Transactions on Knowledge and Data Engineering | 8.9 | IEEE | 1041-4347 |
Full Name | Impact Factor | Publisher |
---|---|---|
Applied Sciences | 2.500 | MDPI |
Information Fusion | 15.5 | Elsevier |
Information Processing & Management | 6.9 | Elsevier |
IEEE Transactions on Knowledge and Data Engineering | 8.9 | IEEE |