Conference Information
RQD 2020: ISSAT International Conference on Reliability and Quality in Design
https://www.issatconferences.org/rqd2020.htmlSubmission Date: |
2020-04-15 Extended |
Notification Date: |
2020-04-30 |
Conference Date: |
2020-08-06 |
Location: |
Miami, Florida, USA |
Years: |
26 |
Viewed: 8505 Tracked: 0 Attend: 0
Call For Papers
About the Conference RQD 2020 is a major international conference event in the fields of reliability, risk assessment, quality in designs and statistics. For a quarter of a century, ISSAT RQD conference has brought together internationally renowned scholars, professors and researchers as well as scientists, engineers, practitioners, professionals and students worldwide to share, discuss and advance their research findings. The presented papers as well as keynote addresses were of high quality. ISSAT RQD conference has been greatly beneficial to its participants for their research and a starting place for many new collaborative works. Topics of Interest Reliability Reliability Modeling and Testing Software Reliability and Testing Human Factors and Reliability Statistical Approaches in Reliability Network Reliability Risk Assessment Modeling Fault Tolerance Modeling Analysis and Simulation Quality Assurance and Cost Issues Optimization Survival Data Analysis Quality Engineering Quality Planning and Measurements Maintainability and Availability Methodologies for Quality Control Software and Algorithms Total Quality Management Techniques Design Issues in Manufacturing Engineering Design Optimization Experimental Design for Quality Control Performance Analysis Process Control and Management Parallel and Distributed Computing Concurrent Engineering and Design Big Data Cloud Computing Data Collection and Analysis Data Computing Data Mining and Analytics Life Testing Robust Design Security Analytics Safety-Critical and High Assurance Systems Service Sciences
Last updated by Dou Sun in 2020-04-03
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IEEE Journal on Emerging and Selected Topics in Circuits and Systems | 3.700 | IEEE |
International Journal of Wireless Information Networks | 1.500 | Springer |
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