会議情報
EPTC 2018: Electronics Packaging Technology Conference
https://www.eptc-ieee.net/提出日: |
2018-07-27 Extended |
通知日: |
2018-08-15 |
会議日: |
2018-12-04 |
場所: |
Singapore |
年: |
20 |
閲覧: 13255 追跡: 0 出席: 0
論文募集
CONFERENCE TOPICS
Advanced Packaging: Advanced Flip-chip, 2.5D & 3D,PoP, embedded passives & actives on substrates, System in Packaging, embedded chip packaging technologies, Panel level packaging, RF, Microwave & Millimeter-wave, Power and Rugged Electronics Packaging etc.
TSV/Wafer Level Packaging: Wafer level packaging ( Fan in/Fan out), embedded chip packaging, 2.5D/3D integration, TSV, Silicon & Glass interposer, RDL, bumping technologies, etc.
Interconnection Technologies: Au/Ag/Cu/Al Wire-bond / Wedge bond technology, Flip-chip & Cu pillar, solder alternatives (ICP, ACP, ACF, NCP, ICA), Cu to Cu, Wafer level bonding & die attachment (Pb-free) etc.
Emerging Technologies: Packaging technologies for MEMS, biomedical, optoelectronics, Internet of things, photo voltaic, printed electronics, wearable electronics, Photonics, LED, etc.
Materials and Processing: advanced materials such 3D materials, photoresist, polymer dielectrics, solder materials, die attach, underfill, Substrates, Leadframes, PCB etc for advanced packaging, and assembly processes using advanced materials.
Equipment and Process Automation: new processes development, equipment automation, equipment hardware development/ improvements, data analytics, in-situ metrology.
Electrical Simulations & Characterization: Power plane modeling, signal integrity analysis of package. 2D/2.5D/3D package level high-speed signal design, characterization and test methodologies, etc.
Mechanical Modeling & Simulations: Thermo-mechanical, moisture, fracture, fatigue, vibration, shock and drop modeling, Chip-package interaction, etc.
Thermal Characterization & Cooling Solutions: Thermal modeling and simulation, component, system and product level thermal management and characterization.
Quality, Reliability & Failure Analysis: Component, board, system and product level reliability assessment, Interfacial adhesion, accelerated testing, failure characterization, etc.
最終更新 Dou Sun 2018-07-23
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関連仕訳帳
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| Cryptography and Communications | 1.200 | Springer | 1936-2447 | |
| Complex Adaptive Systems Modeling | Springer | 2194-3206 | ||
| Frontiers in ICT | Frontiers Media S.A. | 2297-198X | ||
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| International Journal of Control Theory and Computer Modeling | AIRCC | 2319-4138 | ||
| International Journal of Control, Automation, and Systems | 2.500 | Springer | 1598-6446 | |
| IEEE Control Systems Magazine | 3.900 | IEEE | 1066-033X | |
| Scientific Programming | Hindawi | 1058-9244 |
| 完全な名前 | インパクト ・ ファクター | 出版社 |
|---|---|---|
| Supercomputing Frontiers and Innovations | South Ural State University | |
| IEEE Transactions on Energy Markets, Policy and Regulation | IEEE | |
| Cryptography and Communications | 1.200 | Springer |
| Complex Adaptive Systems Modeling | Springer | |
| Frontiers in ICT | Frontiers Media S.A. | |
| Molecular Simulation | 1.900 | Taylor & Francis |
| International Journal of Control Theory and Computer Modeling | AIRCC | |
| International Journal of Control, Automation, and Systems | 2.500 | Springer |
| IEEE Control Systems Magazine | 3.900 | IEEE |
| Scientific Programming | Hindawi |