Basic Information
Name: Ar Lee
Institution: Tsinghua University
Registration: 2023-09-23
Score: 86
Tracked Conferences
CCF | CORE | QUALIS | Short | Full Name | Submission | Notification | Conference |
---|---|---|---|---|---|---|---|
a | a* | a1 | CVPR | IEEE Conference on Computer Vision and Pattern Recognition | 2023-11-03 | 2024-02-26 | 2024-06-17 |
Short | Full Name | Submission | Conference |
---|---|---|---|
CVPR | IEEE Conference on Computer Vision and Pattern Recognition | 2023-11-03 | 2024-06-17 |
Attend Conferences
CCF | CORE | QUALIS | Short | Full Name | Conference | Location |
---|---|---|---|---|---|---|
a | a* | a1 | CVPR | IEEE Conference on Computer Vision and Pattern Recognition | 2024-06-17 | Seattle, Washington, USA |
Full Name | Conference | Location |
---|---|---|
IEEE Conference on Computer Vision and Pattern Recognition | 2024-06-17 | Seattle, Washington, USA |
Tracked Journals
CCF | Full Name | Impact Factor | Publisher | ISSN |
---|---|---|---|---|
b | Computer Vision and Image Understanding | 3.876 | Elsevier | 1077-3142 |
Full Name | Impact Factor | Publisher |
---|---|---|
Computer Vision and Image Understanding | 3.876 | Elsevier |
Followed Researchers
Name | Institution | Registration | Score |
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No results found. |
Name | Institution | Score |
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No results found. |
Tracked Jobs
Job Title | Employer | Job Location |
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No results found. |
Job Title | Employer | Job Location |
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No results found. |
Viewed Conferences
CCF | CORE | QUALIS | Short | Full Name | Submission | Notification | Conference |
---|---|---|---|---|---|---|---|
a | a* | a1 | CVPR | IEEE Conference on Computer Vision and Pattern Recognition | 2023-11-03 | 2024-02-26 | 2024-06-17 |
Short | Full Name | Submission | Conference |
---|---|---|---|
CVPR | IEEE Conference on Computer Vision and Pattern Recognition | 2023-11-03 | 2024-06-17 |
Viewed Journals
CCF | Full Name | Impact Factor | Publisher | ISSN |
---|---|---|---|---|
Measurement: Sensors | Elsevier | 2665-9174 | ||
IEEE Communications Surveys & Tutorials | 22.97 | IEEE | 2373-745X | |
IEEE Access | 4.098 | IEEE | 2169-3536 | |
b | Computer Vision and Image Understanding | 3.876 | Elsevier | 1077-3142 |
a | IEEE Transactions on Pattern Analysis and Machine Intelligence | 17.73 | IEEE | 0162-8828 |
b | Journal of Symbolic Computation | 0.970 | Elsevier | 0747-7171 |
Full Name | Impact Factor | Publisher |
---|---|---|
Measurement: Sensors | Elsevier | |
IEEE Communications Surveys & Tutorials | 22.97 | IEEE |
IEEE Access | 4.098 | IEEE |
Computer Vision and Image Understanding | 3.876 | Elsevier |
IEEE Transactions on Pattern Analysis and Machine Intelligence | 17.73 | IEEE |
Journal of Symbolic Computation | 0.970 | Elsevier |