Basic Information
Name: Jian Hu
Institution: National University of Defense Technology
Registration: 2019-06-24
Score: 619
Tracked Conferences
CCF | CORE | QUALIS | Short | Full Name | Submission | Notification | Conference |
---|---|---|---|---|---|---|---|
b | b | a1 | ITC | International Test Conference | 2022-03-14 | 2022-06-06 | 2022-09-26 |
c | b2 | ETS | European Test Symposium | 2021-12-10 | 2022-02-11 | 2022-05-23 | |
c | a2 | ASP-DAC | Asia and South Pacific Design Automation Conference | 2021-07-21 | 2021-09-11 | 2022-01-17 | |
AUTEEE | IEEE International Conference on Automation, Electronics and Electrical Engineering | 2020-08-30 | 2020-09-15 | 2020-11-20 |
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Short | Full Name | Submission | Conference |
---|---|---|---|
ITC | International Test Conference | 2022-03-14 | 2022-09-26 |
ETS | European Test Symposium | 2021-12-10 | 2022-05-23 |
ASP-DAC | Asia and South Pacific Design Automation Conference | 2021-07-21 | 2022-01-17 |
AUTEEE | IEEE International Conference on Automation, Electronics and Electrical Engineering | 2020-08-30 | 2020-11-20 |
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Attend Conferences
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Tracked Journals
CCF | Full Name | Impact Factor | Publisher | ISSN |
---|---|---|---|---|
Electronic Notes in Theoretical Computer Science | Elsevier | 1571-0661 | ||
c | Integration, the VLSI Journal | 1.211 | Elsevier | 0167-9260 |
c | Future Generation Computer Systems | 7.307 | Elsevier | 0167-739X |
c | Journal of Electronic Testing: Theory and Applications | 0.554 | Springer | 0923-8174 |
Full Name | Impact Factor | Publisher |
---|---|---|
Electronic Notes in Theoretical Computer Science | Elsevier | |
Integration, the VLSI Journal | 1.211 | Elsevier |
Future Generation Computer Systems | 7.307 | Elsevier |
Journal of Electronic Testing: Theory and Applications | 0.554 | Springer |
Followed Researchers
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Tracked Jobs
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Viewed Conferences
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Viewed Journals
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