Basic Information
Name: Bob SMITH
Institution: Sun Yat-sen University
Registration: 2018-11-28
Score: 297
Tracked Conferences
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Attend Conferences
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Tracked Journals
| CCF | Full Name | Impact Factor | Publisher | ISSN |
|---|---|---|---|---|
| a | IEEE Transactions on Pattern Analysis and Machine Intelligence | 20.80 | IEEE | 0162-8828 |
| Full Name | Impact Factor | Publisher |
|---|---|---|
| IEEE Transactions on Pattern Analysis and Machine Intelligence | 20.80 | IEEE |
Followed Researchers
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Tracked Jobs
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Viewed Conferences
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Viewed Journals
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