Conference Information
SEIA 2020: International Conference on Sensors and Electronic Instrumentation Advances
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Submission Date:
2020-05-15
Notification Date:
2020-06-05
Conference Date:
2020-09-23
Location:
Porto, Portugal
Years:
6
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Call For Papers
Sensors and Sensing Technology

Accelerometers
Inclinometers
Gyroscopes
Mechanical Sensors
Optical Sensors
Optical Fiber Sensors
Photonic Sensors
Chemical Sensors
Biosensors
Immunosensors
BioMEMS
Temperature Sensors
Pressure Sensors
Acoustic Sensors
Electromagnetic Sensors
Gas Sensors
Humidity Sensors
Infrared Sensors, Devices and Thermography
Radiation Sensors
Multi Sensor Fusion
Smart Sensors
Intelligent Sensors
Virtual Sensors
Sensor Interfacing and Signal Conditioning
Sensor Calibration
Nanomaterials and Electronics Technology for Sensors
Semiconductor Materials for Sensors
Polymer Materials for Sensors
MEMS and NEMS
Remote Sensors and Telemetry
Sensor Applications

Sensor Instrumentation and Measuring Technology

Metrology and Measurement Science
Methods of Measurements
Calibrations and Standards
Measurement of Electrical Quantities
Time and Frequency Measurements
Measurement of Force, Mass, Torque, Inclination and Acceleration
Magnetic Measurements
Hardness Measurements
Measurement of Geometrical Quantities
Temperature and Thermal Measurements
Pressure and Vacuum Measurements
Vibration and Noise Measurement
Flow Measurements
Chemical Measurements
Quantum Measurements and Photonics
Acoustics and the Ultrasonic Measurements
Environmental Measurements
Power and Energy Measurements
Measurement of Human Functions
Measurements in Biology and Medicine
Mathematical Tools for Measurements
Optical and Radiation Measurements
Microwave Measurements
Virtual Instruments and Data Acquisition Systems
Software Measurements
Measurement Systems
Distributed Measurements
Analog-to-Digital Converters, Digital and Mixed Signal Processing
Waveform Analysis and Measurements
Scientific and Industrial Instrumentation
Cyber-Physical Systems and IoT
Experimental Mechanics
Measurement in Robotics
Metrology in Food and Nutrition
Intelligent and Computer Vision Instruments
Reliability of Instrument and Measurement Systems
Nanometrology
Technical Diagnostics and Testing
Nondestructive Testing
Education and Training in Measurement and Instrumentation

Contribution Types:

Keynote presentations
Invited talks
Industrial presentations
Regular papers
Posters

Special Sessions:

Authors are welcome to manage special sessions during the conference. Each session will contain 4-6 papers in a related field as specified above

Session organizers will get:

- Certificate of Appreciation
- Free Registration
- Special Publishing Theme within Conference Proceedings
Last updated by Dou Sun in 2020-04-01
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