会议信息
DTIS 2018: IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era
http://www.lirmm.fr/DTIS18/截稿日期: |
2018-01-20 Extended |
通知日期: |
2018-02-26 |
会议日期: |
2018-04-10 |
会议地点: |
Taormina, Italy |
届数: |
13 |
浏览: 8429 关注: 0 参加: 0
征稿
Aim of the Conference: to cope with the rapidly progressing technology which, today, reaches the nanometer scale. The areas of interest include the design, test and technology of electronic products, ranging from integrated circuit modules and printed circuit boards to full systems and microsystems, as well as the methodologies and tools used in the design, verification and validation of such products. Topics of the conference include, but are not limited to: -Integrated Systems Design -Integrated Systems Technology -Integrated Systems Testing
最后更新 Dou Sun 在 2017-12-30
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| Archive for Mathematical Logic | 0.400 | Springer |
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