The IEEE European Test Symposium (ETS) is Europe's premier forum dedicated to presenting and discussing scientific results, emerging ideas, applications, hot topics and new trends in the area of electronic-based circuits and system testing, reliability, security and validation. In 2025, ETS will take place in Swissotel in Tallinn. The city is known for the picturesque Old Town with its medieval architecture. It is organized by the Tallinn University of Technology (TalTech), which co-sponsors the event jointly with the IEEE Council on Electronic Design Automation (CEDA). In addition to scientific paper submissions, ETS offers a track for informal contributions dedicated to early hot ideas and relevant case studies as well as a PhD forum. A Test Spring School and Fringe Workshops will be organized in conjunction with ETS'25.

This year we will celebrate the anniversary 30th edition of ETS!

You are invited to participate and submit your contributions to ETS'25. The areas of interest include (but are not limited to) the following topics:

    3D IC and SiP Test
    Analog, Mixed-signal and RF Test
    Approximate Circuit Testing
    ATE Hardware and Software
    Automatic Test Generation
    Automotive and Avionics Test
    Board Test and Diagnosis
    Built-In Self-Test
    Current-Based Test
    Defect-Based Test
    Delay and Performance Test
    Dependability
    Design for Test
    DfX (Design for Manufacturing, Reliability, Yield, etc.)
    Diagnosis and Silicon Debug
    Economics of Test
    Extra-Functional Aspects
    Failure Analysis
    Fault Modeling
    Fault Simulation
    Fault Tolerance
    Functional Safety
    Hardware Security
    Heterogeneous and Emerging Architectures
    High-Speed I/0 Test
    IoT and CPS Dependability
    Low-Power Test
    Machine Learning and Test
    Memory Test and Repair
    Microsystems / MEMS / Sensors Test
    On-line Test
    Power- / Thermal-Aware Test
    Processor Test (Multi-Core, GPU, CPU, Neuromorphic, etc.)
    Security-Test Trade-offs
    Self-X (Awareness, Repair, Test, etc.)
    Signal Integrity Test
    SoC and NoC Test
    Standards in Test
    Test for Reversible and Quantum Circuits
    Test of Reconfigurable Systems (FPGA, CPLD, etc.)
    Test, Reliability and Security of Emerging Technologies
    Trojan Detection
    Verification and Validation
    Yield Analysis and Enhancement