Overview

The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world to exchange innovative ideas on system, board, and device testing with design, manufacturing, and field consideration in mind.

Scope

Topics of interest include (but are not limited to):

    Analog/Mixed-Signal Test
    Automatic Test Generation
    Board Test and Diagnosis
    Boundary Scan Test
    Built-In Self-Test (BIST)
    Connectivity Testing
    Defect-Based Test
    Delay and Performance Test
    Dependability and Functional Safety
    Design for Test (DFT)
    Diagnosis and Silicon Debug
    Economic of Test
    Failure Analysis
    Fault Modeling and Simulation
    Fault Tolerance
    GPU Test
    Hardware-Oriented Security and trust
    High-Speed I/O Test
    Low-Power IC Test
    Machine Learning in Test
    Memory Test and Repair
    Multi-/Many-core Processor Test
    Online Test
    Power/Thermal/Reliability Issues in Test
    Reconfigurable System Test
    RF Test
    Self-Repair
    SiP, Stacked, 3D IC Test
    Standards in Test
    Test Compression
    Test for Biomedical Circuits and Systems
    Test for MEMS and Microfluidic Systems
    Test for Nanoscale Devices and Emerging Technologies
    Test for Reversible and Quantum Circuits
    Test for Sensors and IoT
    Test Quality
    Test Synthesis
    Validation and Verification
    Yield Analysis and Enhancement